X-ray reconstruction topography for observation of the orientation distribution in a single crystal

A microcomputer-assisted reconstruction topography technique has been devised for observation of the distribution of subgrain orientations in a single crystal. The orientation at a specific location is computed, with data from X-ray scattering topographs, by a microcomputer. The reconstruction topograph showing the orientation distribution consists of two topographs, one showing the rotation-angle distribution around an axis and the other the orientation distribution of the rotation axis. The system capability has been demonstrated by observations of an iron-3wt% silicon alloy with an orientational resolution of 2.0′ and a spatial resolution of less than 48 μm. Emphasis is placed on the fact that this is the first proposal for X-ray topography involving spectroscopy.