Electron Diffraction Patterns of Fibrous and Lamellar Textured Polycrystalline Thin Films. I. Theory

The reciprocal lattices of fibrous and lamellar textured polycrystalline thin films are analyzed on the basis of the number of distinct angles made between planes of {hkl} families with the texture axis. Tables of the maximum possible number of such distinct angles between any given direction/plane and all faces of a given family of planes for all the crystal systems are included in this paper. Based on these reciprocal lattices, parallel and tilted electron-diffraction-pattern characteristics of the textured films are elucidated. A method of indexing the arced electron diffraction patterns of the textured films is proposed. This method can be applied to both the fibrous and lamellar texture films of all crystal structures. Formulas that relate the angles subtended by diffraction arcs to the distribution angle of the texture axis are presented.