Diffraction by Diffusely Scattering Materials of High Transparency

Even with well aligned modern diffractometers, the wide-range diffraction patterns of diffusely scattering materials are distorted owing to factors associated with finite specimen length, strong Compton scattering, high X-ray transparency causing asymmetric broadening and displacement of interference maxima towards smaller angles, and possibly small-angle scattering. The small-angle scattering can extend far enough to overlap the first interference maximum and the peak displacement can lead to significant d-spacing errors. Simple methods of correcting for these distortions are presented. These corrections are especially important in situations where overlapping peaks are present.