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Nonlinear equations are given for determining the crystallographic orientation of surfaces of single crystals. The equations are solved by an iterative method in several variables. The angle φ between the surface plane and the lattice plane in question is decomposed into two components α and β. These two components are obtained from the solution of a nonlinear system of equations using two measurements and the Bragg angle. The diffractometric system considered is the well known θ/2θ with a sufficiently large area of X-ray detection and the capability of holding single-crystal samples. The results obtained are discussed from experimental and theoretical points of view.