Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
We have developed new software for locating heavy-atom sites for phase determination from single isomorphous replacement (SIR) and multiwavelength anomalous diffraction (MAD) data. The first component of the software is a program for finding heavy-atom sites when presented with SIR (i.e. native and derivative) structure-factor amplitudes or MAD-FA structure-factor amplitudes (i.e. the derived structure factors corresponding to the anomalously scattering atoms). The principle on which this program is based is a reciprocal-space maximization of a Patterson correlation coefficient between the SIR or MAD-FA data and the calculated intensities from search atoms placed at trial positions. The program has been successfully tested on two sets of SIR data for the cytochrome c' protein and on MAD-FA data from the DnaK protein. The second component of the software is a three-dimensional viewer which may be used to assess difference Patterson maps and which provides peak-picking and atom-editing facilities for interpreting cross-difference Fourier maps.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds