Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
A compact furnace has been developed, for low-background high-temperature X-ray studies, that can be used routinely with an on-line imaging-plate scanner (MAR Research). The furnace operates under an inert-gas atmosphere between ambient temperature and 1500 K with a relative thermal stability of ±0.5 K in long-time experiments, and an absolute thermal reproducibility of 1% of the setting temperature in successive runs. Computer-controlled temperature regulation permits the automatic collection of in situ diffraction data on single crystals as well as on polycrystalline samples. Further characteristics are a large opening angle (2θ = 37°) window for diffracted beams allowing the collection of extensive data sets with Mo radiation, low construction costs and easy handling. The practicability of the furnace is demonstrated on the example of decagonal Al72.7Co11.6Ni15.7, which undergoes in the range between ambient temperature and 1200 K several phase transitions connected with complex scattering phenomena.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds