Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
An accurate expression of the de Wolff figure of merit has been derived from statistical analysis as Mn = ΣNk = 1[(Q(k)Q(k−1))2/4]/Q(N){\bar delta}n, where Q(k), is the Q value of the kth distinct calculated line and {\bar delta}n, is the average of the actual discrepancies expressed in Q values between the observed lines and the calculated lines up to the last Nth line which is nearest the last nth observed line. This expression more appropriately reflects the reliability of indexing a given powder pattern, and thus the correctness of the original expression of the figure is estimated by this expression. To simplify the calculation, an alternative approximate expression for the figure of merit, M*n = S/V2/3{\bar delta}n, is derived from a suggested relationship between the volume of the unit cell, V, and the d values, where S is a symmetry factor. This expression is recommended as an intermediate testing criterion to limit the size of the solution field in the semi-exhaustive trial-and-error computer indexing. A number of examples of indexing are discussed to support the above comments.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds