Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
A method for estimating the interface widths in multiple quantum well (MQW) structures is described. Generally it has been assumed that the average interface shapes on each side of a quantum well are the same, yet there is no reason to assume that this is correct. The method presented here can predict the interface profile on both sides of a quantum well and therefore detect the presence of any asymmetry. The results are compared with the more familiar predictive Fourier transform approach and qualitative agreement is observed, although the latter cannot predict any asymmetry. Deducing the interface width from the predictive Fourier transform method can be difficult because of series termination effects and could possibly be misleading if insufficient satellites are measured. The limitations are essentially by-passed with the described approach. A simple method for deriving period variations is also given and in the example presented this amounts to about two monolayers. The interface widths in this example are 6.5 and 5.4 monolayers and these best-fit values give an R-factor just above that which could be expected from the data. Also the fit for two similarly graded interfaces results in a significant worsening in the agreement.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds