The application of synchrotron radiation to X-ray multiple-diffraction studies

Multiple diffraction using parallel-beam synchrotron X-radiation is described. Data recorded on the Daresbury Synchrotron Radiation Source from a single-crystal of InSb are presented and compared with data recorded with the pseudo-Kossel technique. The wide-beam synchrotron technique has demonstrated for the first time the feasibility of the synchrotron radiation multiple-diffraction topographic technique. Potential applications for this technique in the characterization of low-dimensional structures are outlined.