Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
An energy-scanning X-ray diffraction technique is used to study a synthetic periodic multilayer structure with two amorphous components. The source was the Bremsstrahlung from the X-ray tube, and the detector was a silicon-lithium diode. Experimental results obtained for a multilayer PdSi/MgCu with large period show a deviation from the classical Bragg's law. The deviation is produced by the variation of the refractive index of the multilayer with the wavelength of the incident X-ray. The period d was determined to within 1%. A measure of the refraction index enabled an estimate to be made of the width of each layer. It was also possible to estimate the fluctuation of the period along the multilayer from the full widths of the diffracted Bragg peaks at maximum intensities. The limits of the method are discussed.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds