An X-ray spectrometer for inelastic scattering experiments. II. Spectral flux and resolution

Using the calculated angular dependence of the X-ray reflectivities of elastically curved perfect crystals presented in paper I [Suortti, Pattison & Weyrich (1986). J. Appl. Cryst. 19, 336-342], It is possible to predict both the spectral flux and energy resolution for various curved-crystal geometries. This analysis is applied both to dispersive and scanning types of X-ray spectrometers. It is shown that, when using optimized monochromator and analyzer components, it should be possible to measure Compton profiles with good statistics and resolution in a time scale of one or two days per profile. Furthermore, it is argued that the scanning spectrometer has a number of advantages, particularly regarding the signal-to-noise ratio. Details of the design and performance of an X-ray spectrometer of this type will be given in paper III, which follows [Pattison, Suortti & Weyrich (1986). J. Appl. Cryst. 19, 353-363].