An orientation-matrix approach to Laue indexing

A Laue indexing method is described which employs an orientation-matrix approach; it is especially suited for use in the case of a diffractometer equipped with a position- and energy-sensitive detector at a pulsed neutron source or synchrotron X-ray source. The crystal can be in any orientation and lattice constants need not be known. Using this method positional and wavelength information can be easily converted into a form suitable for an automatic indexing procedure in order to obtain indices and an orientation matrix, or with knowledge of the latter to predict positions of reflections incident on a detector centered at any desired 2θ.