Use of kinematical diffraction in X-ray topography

A new X-ray topographic method is proposed that makes use of the kinematical diffraction component, which is significantly more sensitive to the crystal-surface imperfections than dynamical Laue-Bragg diffraction. The sensitivity of the method has been studied using a triple crystal diffractometer to separate kinematical and dynamical components of the diffraction intensity curve when the Bragg condition is nearly satisfied.