The use of an array processor for the simulation of X-ray topographs

The use of a varying-step algorithm now allows the simulation of traverse topographs and of section topographs taking into account the real width of the incident beam. However, computation time remains a critical factor in practical use. With an array processor it is possible to decrease the computation time significantly. It is shown that pictures of good quality may be obtained in a reasonable time using local facilities. The influence of various parameters on the accuracy of the simulations is discussed. It is demonstrated that local machines can be more useful, in crystallography, than giant computers often difficult to reach through the network of communications.