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The measurement of the spectral intensity distribution of the incident beam in energy-dispersive X-ray diffractometry has been examined by several methods. The spectral distribution estimated from the integrated intensity of a well defined reflection at several energies is the most reliable. Three direct measurements of the spectral distribution by a solid-state detector are also examined. Of these only the measurement at very low tube current can be used in structure factor determination, but the accuracy is about 5% even for strong reflections.

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