Quantitative analysis of intensitities in X-ray topographs by enhanced microfluorescence

A method is presented for enhancing the fluorescence of the silver precipitates in the microfluorescent analysis of X-ray topographs by scanning electron microscopy or similar electron microprobes. The method is based on the indirect excitation of the silver fluorescence by depositing a thin suitable metal film on the emulsion of a nuclear track plate. Theoretical aspects of the method are presented and experimentally verified. The method was applied to determine the elastic strain distribution in a bent silicon plate containing a hole by measuring the opacities of the exposed and developed topograph obtained from the specimen.