Crystal data for CuGa_xIn_1−xTe₂

A series of samples in the system CuGaxIn_1−xTe₂, 0 ≤ x ≤ 1, has been synthesized and characterized by X-ray diffraction. All the samples have a chalcopyrite-type structure, the unit-cell parameters a and c and the ratio c/a changing linearly with x. The unit-cell parameters for the compounds with x = 1, 0.80, 0.65, 0.50, 0.30, 0.15 and 0 and the powder diffractometer data for x = 1, 0.5 and 0 are given at 298 K. CuGaTe₂: a = 6.021(2), c = 11.937(5) Å, V = 432.75 ų, D_x = 5.96 g cm^{− 3}; CuGa_0.80In_0.20Te₂: a = 6.053(2), c = 12.039(4) Å, V = 441.09 ų, D_x = 5.99 g cm^{− 3}; CuGa_0.65In_0.35Te₂: a = 6.084(2), c = 12.107(7) Å, V = 448.14 ų, D_x = 5.99 g cm⁻³; CuGa_0.50In_0.50Te₂: a = 6.107(2), c = 12.177(7) Å, V = 454.15 ų, D_x = 6.01 g cm⁻³; CuGa_0.30In_0.70Te₂: a = 6.144(2), c = 12.296(7) Å, V = 464.16 ų, D_x = 6.01 g cm⁻³; CuGa_0.15In_0.85Te₂: a = 6.168(3), c = 12.355(10) Å, V = 470.04 ų, D_x = 6.03 g cm⁻³; CuInTe₂: a = 6.195(2), c = 12.418(6) Å, V = 476.58 ų, D_x = 6.04 g cm⁻³. The JCPDS Diffraction File Nos. are: 34-1500 for CuGaTe₂; 34-1498 for CuInTe₂; 34-1499 for CuGa_0.50In_0.50Te₂.