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A method of indirect analysis of X-ray diffraction patterns of homogeneous hydrated microcrystalline silicates is introduced. This method is applied to a sodium beidellite of Rupsroth, Bavaria, Germany, hydrated with two water layers to determine all its structural characteristics: namely, the average dimension and size distribution of coherent domains, stacking mode of the layers along the c* direction, levels and number per unit cell of water molecules. A critical analysis on the `concept of homogeneity' of hydrates and a discussion on the conditions of its application to lamellar microcrystalline silicates with a few numbers of layers are made.

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