Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
Diffraction contrast phenomena on X-ray topographs taken with continuous-spectrum synchrotron radiation have been studied at wavelengths of 0.057, 0.064, 0.071, 0.100, 0.154, 0.206 and 0.250 nm. The specimen was a polished plate of natural diamond with surfaces parallel to (110), ½ mm thick. Using the {\bar 1}11 reflection and a stored electron beam energy of 1.8 GeV all topographs (except that taken with λ = 0.25 nm) were harmonic free. The specimen exhibited mixed-habit growth, containing sectors of normal faceted {111} growth and sectors of non-faceted `cuboid' growth in which growth-surface orientation was variable and only approximately parallel to {100}. Prior to X-ray topography the specimen had received localized damage from implantation with fluorine ions of 17 MeV energy. Features whose variation with wavelength was studied included (1) the relative strengths of integrated reflections from {111} and `cuboid' growth sectors, (2) the intensity of `spike' disorder diffuse reflections relative to sharp Bragg reflections, (3) contrast from inclusions, polishing striae and fracture damage and (4) lattice bending and diffraction contrast at the sites of fluorine ion implantation. Theoretical predictions of the wavelength variation of the intensity of the diffuse reflection images and of contrast due to resolved defects showed good agreement with the observations.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds