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A mean-square refinement method for X-ray powder diffractometer patterns is applied to the comparison of computed and observed line profiles which are given by a more or less disordered lamellar solid. This method is also developed for the study of a two-phase system. The discussions of the role of the different parameters which permit the physical model to be connected to its mathematical representation, and the criticism of the validity range of the different theoretical expressions, are extendable to the study of other kinds of material.

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