The calculation of intensities diffracted by a partially oriented powder with a layer structure

It is well known that the orientation of particles inside a sample modifies the diffracted intensities. The present paper shows how this orientation can be introduced into the intensity calculations in order to reproduce the experimental diagrams. The calculations are presented for the case of asymmetrical diffraction. This corresponds not only to the conditions of photographic recordings but also to recordings with a linear detector, which is currently used. The symmetrical diffraction is envisioned as a limit case.