Absorption correction and normalization of X-ray small-angle scattering data for materials producing intense scattering at extremely low angles

Some materials of low absorption that contain particles in the several thousand Å range can produce an intensity of small-angle scattering that is a significant fraction of that of the transmitted beam. This is quite apparent in the range of a few s scattering angle when a Bonse–Hart small-angle scattering diffractometer is used. A method was developed that allows an accurate absorption correction to be calculated when the scattering by the sample can be approximated by an exponential function in the range of 0 to 5 s double Bragg angle 2θ. Variation of sample thickness allows the correction method to be checked.