Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
A computation method is presented which allows a rapid indexing of any unknown spot pattern obtained by back-reflection or transmission Laue methods. The Cartesian coordinates of n spots are measured in an orthonormal frame referred to the photographic film. Two spots 1 and 2 separated by a wide angular distance αm are carefully chosen. Their indices are assumed to be less than 5. The set (E) of all the pairs of planes (h1k1l1) and (h2k2l2) making an angle α close to αm is then computed. Since the pair of reflecting planes related to spots 1 and 2 belongs to (E), each computed pair of planes is tried, in order to determine the orientation of the crystal and to check whether the coordinates of the (n−2) other spots can be matched to dense planes of indices less than 8. If the uncertainty of the measurements is high or if n is too low, this method gives the possible orientations for the crystal. Plane indices less than 8 have been identified in cubic, tetragonal and orthorhombic crystals.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds