Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
The profile-fitting method was used to analyze data, collected at speeds up to 1° (2θ) per second with a computer-controlled diffractometer, which gave precise values of intensities and angles of reflections above a selected intensity threshold level. Powder diffraction data with 52 reflections in a 40° range were collected and analyzed in a few minutes. This technique has also been applied to X-ray fluorescence spectroscopy, and is applicable to single-crystal diffractometry and wavelength-dispersive electron microprobe analysis.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds