Etudes de couches minces d'ytterbium par diffraction X in situ

An X-ray diffraction analysis in situ has been performed on ytterbium metal thin films condensed on amorphous substrates. An energy-scanning X-ray diffraction technique is used. The principle and the particular conditions for utilization of apparatus are described. Under the conditions, one observes in the temperature range 77 to 340 K the coexistence of the h.c.p. (2H) and f.c.c. (3C) phases. The observation of 10.0 and 10.1 h.c.p. and 200 f.c.c. lines is discussed in terms of stacking faults and coherent domains. The deposits were made at different temperatures and annealed and quenched. Electron microscopy and diffraction observations were made on single crystals. The 2H et 3C phases can be seen coherently intergrown as microdomains.