Application of X-ray synchrotron topography to in situ studies of recrystallization

It is demonstrated that X-ray topography with synchrotron radiation provides an excellent means of simultaneously measuring the size and orientation of grains in polycrystalline materials. The technique, which also provides data on the lattice strains, is particularly suited to studies of grain growth at high temperatures and preliminary studies of recrystallization in iron-silicon alloy sheet are reported. The initial radial-growth rate is constant and approximately equal for all grains studied in one recrystallization.