Correction des aberrations instrumentales: critères expérimentaux pour l'utilisation des méthodes de déconvolution

The correction of instrumental aberration influencing the shape of diffraction lines requires the use of deconvolution processes. Practically, when the half-height line width of the defect functions is not larger than one sixth of the line to be analysed, deconvolution is useless. The deconvolution processes can be easily performed when the width of the defect functions remains smaller than half the line width. For the two rules, graphs are presented that allow one to predict the adequate slit width and the sample thickness used on a X-ray goniometer.