Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
In the computer indexing of powder diffraction patterns, an advance estimate of the volume of the unit cell is extremely valuable. This paper describes a method for estimating it directly from powder-pattern data for the case of triclinic materials. The method involves an easily prepared graphical plot, the slope of which is proportional to the unit-cell volume. First, the diffraction lines are numbered consecutively, starting with the largest d value (N = 1). A plot is then made of 1/N versus d3. Theoretically, the resulting line has a slope of 3/(2πV) = 0.4775/V for triclinic compounds, where V is the unit-cell volume. Examination of the graphs plotted for a number of triclinic materials where the experimental data are of high quality shows that the slope consistently falls around 0.60/V. Hence, the volume of the unit cell and/or the calculated density can be estimated. In addition, this analysis gives a numerical measure of the fraction of possible diffraction lines actually observed.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds