Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
The method of determining the ratio between lattice parameter and electron wavelength from Kikuchi-line intersections with an accuracy about 0.1% which was described by Høier [Acta Cryst. (1969). A25, 516-518] for cubic crystals, is extended to crystals with any lower symmetry. A computer program using a least-squares refinement has been developed and applied to the determination of unknown lattice parameters in an orthorhombic olivine and a triclinic feldspar crystal. A combination of energy-dispersive X-ray analysis and Kikuchi-line intersection measurements can in many cases be utilized to increase the accuracy in the determination of the lattice parameters. For the feldspars such a combination of measurements can be used to determine the distribution of the Al and Si atoms in the tetrahedral positions of the structure.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds