Buy article online - an online subscription or single-article purchase is required to access this article.
research papers
With almost perfect silicon crystals and cleaved lithium fluoride crystals as extreme examples, the feasibility of using synchrotron radiation for X-ray diffraction topography has been investigated. In both spatial resolution and strain resolution the synchrotron source diffraction topographs are competitive with topographs obtained using conventional X-ray sources but exposure times are reduced from several hours per cm2 to one second per cm2 using standard recording techniques with Ilford nuclear emulsions. Contrary to (the author's) expectations, the instrumentation required is far simpler for synchrotron radiation than for conventional sources.