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The camera described is built as an attachment for the Cameca electron probe microanalyser, interchangeable with the standard specimen-stage drawer. It can be used for transmission-pattern recording, or by the incorporation of a special specimen holder, for back-reflection patterns. In both modes, films are kept in air and are parallel to the specimen surface. The features incorporated in this camera, associated with computer calculations of an analytical treatment of the patterns, take full advantage of Kossel patterns, as a very easy to use, very fast and very accurate X-ray crystallographic technique.