Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(1975).
8
,
201
https://doi.org/10.1107/S0021889875010114
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A precise X-ray diffraction study of elastically deformed silicon monocrystals
T. W. Baker
The study originated from an investigation into the strain induced in silicon crystals when these were mounted on headers in the manufacture of electronic devices, but its development as presented is of more general interest.
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