Diffuse scattering studies of defects in irradiated copper

The integral Huang diffuse X-ray scattering from crystals containing small dislocation loops can be analyzed to obtain two types of information: (1) the size distribution of the loops and (2) the total number of point defects contained in the loops. This technique has been applied to copper crystals irradiated under a number of conditions of neutron irradiation flux, dose and temperature, for which loops are produced, and to selected annealing studies of these loops, with all X-ray measurements made at room temperature.