X-ray study on thin gold films

Gold films of several hundred Ångströms in thickness were evaporated on heated glass substrates. Fourier analysis of the 111 reflexion obtained with Cu Kα radiation showed that the thickness of the film must be fairly constant. After correction for instrumental broadening the 111 line profile was very similar to the theoretical profile of a reflexion from a plate of constant thickness. The thickness was measured in three different ways. It was shown that the first secondary maxima may be unreliable in the measurement of the thickness.