Fourier analysis of the line profiles of talc synthesized from sepiolite

The Fourier coefficients of the line profiles of talc synthesized from sepiolite under hydrothermal conditions (temperatures: 300°C~525; pressure 500 atm) were calculated and interpreted using the method of Warren & Averbach [J. Appl. Phys. (1950), 21, 595; (1952), 23, 497, 1095]. The mean thickness normal to the layer plane of talc synthesized from α-sepiolite is larger than that from β-sepiolite, and the mean thickness for each type of synthesis product tends to increase with higher temperatures of synthesis. The mean square displacement, 〈Z²₁〉, of unit cells in a column of cells perpendicular to the reflection plane generally tends to decrease with higher temperatures of synthesis. The particle-size distribution suggests that particles tend to grow along the c* direction, since the distribution is that of nearly integer multiples of thickness.