The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines

It is shown that the function (truncated integrated intensity × range) versus range has similar theoretical merits to the variance–range function for the analysis of broadened X-ray diffraction lines. A large number of diffraction lines with a range of breadths, provided by samples of lithium ferrite, are analysed by both methods and found to give closely comparable results for the Wilson parameter A′(0)/A(0). In each case the influence of the Kα satellite group is eliminated by exploiting its intensity distribution derived with the aid of the centroid range function. The effects of non-linear range dependent terms on the measured variance slopes and their equivalents from the new analysis are also discussed.