Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
In order to test the collimation correction methods routinely applied to small-angle X-ray scattering data, scattering curves for several samples have been obtained both with a Kratky camera and with a Beeman four-slit collimation system. Since the two collimation systems used quite different slit arrangements, there were appreciable differences in the measured curves obtained with the two systems for a given sample. However, after the appropriate collimation corrections had been applied, the corrected curves were nearly identical. This agreement, which is not surprising because of the thorough tests previously applied to collimation correction procedures, indicates that in the correction of experimental curves, no unforeseen problems appear that are not present in the earlier, more idealized tests, which employed test functions to simulate experimental curves. A comparison has been made of a few other properties of the two collimation systems, including the intensity obtainable for a given resolution.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds