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A computer procedure for slit-height correction of X-ray small-angle scattering curves is described, which Ij based on direct calculation of the desmeared intensity values Ij from the equations Ĩi = ∑jai,jIj where Ĩi is the observed smeared intensity at point i and ai,jIj represents the contribution from a point j along the trace of the primary beam. However, the number of unknown Ij values is reduced by a factor 1/n (n = 3 to 5), and the equations are solved by the method of least-squares. The performance of the method is tested on the diffraction curve of isolated spheres.

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