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Several applications of X-ray topography with Ru-filtered Ag Kα2 radiation are described. Two of these are variations of the Lang method combined with a Ru filter. The first one is to improve the Lang traverse pattern from a specimen crystal including locally highly distorted regions such as inclusions, as demonstrated for a pure iron crystal. The second is to obtain a traverse pattern from the whole area on the same topograph for a specimen including appreciably misoriented parts, by making the first slit wider than usual. This example has been shown for a Ge crystal. Another application is concerned with taking a topograph of an area as wide as of the order of the length of a line focus, in a shorter exposure time, with high resolution. Examples have been shown for Ge and Si crystals.

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