Electronic measurement of electron microscope intensities and energies

A comprehensive device for the electronic measurement of the distribution of electrons in both electron micrographs and diffraction patterns is described. Electrons are detected individually while the image or pattern is scanned across the fixed electron detector, and the resulting information is displayed by a storage oscilloscope and recorded by a chart recorder or punched paper tape. Provision is made to select the energy of the electrons passed to the detector, allowing pictures to be obtained at a given energy level or the energy loss spectrum of a specimen to be examined. Representative results are given.