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A method is presented which combines the analysis of X-ray absorption profiles and selected area X-ray topographs. The method is based on X-ray divergent beam patterns obtained in transmission. The absorption profiles are obtained by unfolding the spectral distribution from the profiles of the deficiency conics, whereas the selected area topographs derive from the corresponding diffraction conics. The synergy of the two techniques makes the method particularly useful for the elucidation of anisotropic effects and inhomogeneities of defect structures. An example is given for the room temperature deformation of beryllium.