Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
In sample-scanning Laue microdiffraction, the local crystal orientation and local deviatoric strain tensor are obtained by illuminating the polycrystalline sample with a broadband `white' (5–30 keV) X-ray microbeam and analyzing the spot positions in the resulting local Laue pattern. Mapping local hydrostatic strain is usually slower, owing to the need to alternate between white and tunable-energy monochromatic microbeams. A technique has been developed to measure hydrostatic strain while keeping the white beam. The energy of one of the Laue spots of the grain of interest is measured using an energy-dispersive point detector, while simultaneously recording the Laue pattern on the two-dimensional detector. The experimental spot energy, Eexp, is therefore measured at the same time as Etheor, the theoretical spot energy for zero hydrostatic strain, which is derived from the analysis of the Laue pattern. The performance of the technique was compared with that of the monochromatic beam technique in two test cases: a Ge single crystal and a micrometre-sized UO2 grain in a polycrystal. Accuracies on the hydrostatic strain Δa/a of ±0.4 × 10−4 and ±1.3 × 10−4 were obtained for Ge and UO2, respectively. Measurement strategies to limit the remaining uncertainties on Etheor are discussed.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds