Download citation
Download citation
link to html
A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented.

Supporting information

pdf

Portable Document Format (PDF) file https://doi.org/10.1107/S0021889810048739/cg5146sup1.pdf
User manual


Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds