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The title compound, [SiH2(C6H7N)4]Cl2·6CHCl3 or C24H30N4Si2+·2Cl-·6CHCl3, contains a hexacoordinated Si atom located on a crystallographic centre of inversion. The coordination of the Si atom can be described as a slightly distorted octahedron, with the 4-picoline ligands in the equatorial plane and the two H atoms occupying axial positions. The title compound is isomorphous with its analogue where the Cl ions are substituted by Br ions.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536801002239/cf6043sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536801002239/cf6043Isup2.hkl
Contains datablock I

CCDC reference: 159844

Key indicators

  • Single-crystal X-ray study
  • T = 150 K
  • Mean [sigma](C-C) = 0.009 Å
  • R factor = 0.069
  • wR factor = 0.181
  • Data-to-parameter ratio = 17.6

checkCIF results

No syntax errors found

ADDSYM reports no extra symmetry


Yellow Alert Alert Level C:
PLAT_420 Alert C D-H Without Acceptor Si1 - H1SI ?
0 Alert Level A = Potentially serious problem
0 Alert Level B = Potential problem
1 Alert Level C = Please check

Comment top

Lewis acid–base complexes between silicon compounds and nitrogen bases have in recent years been the subject of many structural studies (Hensen et al., 1988, 1997; Chuit et al. 1993). In addition to [H2Si(3-picoline)4]Cl2.4CHCl3 (Fleischer et al., 1996), [H2Si(pyridine)4]Cl2.4CHCl3 (Hensen et al., 1998), [H2Si(N-methylimidazole)4]Cl2.3CHCl3 (Hensen, Mayr-Stein et al., 2000), [H2Si(3,4-lutidine)4]Cl2.6CHCl3 (Hensen, Kettner et al., 2000) and [H2Si(3,5-lutidine)4]Br2.2CH3CN (Bolte et al., 2000), the crystal structure of the title compound, (I), is a further example with the structural element SiH2. The title compound is an ionic complex with the Si atom located on a crystallographic centre of inversion and with half a molecule in the asymmetric unit. The coordination of the Si atom can be described as a slightly distorted octahedron, with the picoline ligands in the equatorial plane and the two H atoms occupying axial positions. Two Cl- ions are displaced from the first sphere of coordination. The title compound is isomorphous with its analogue where the Cl ions are substituted by Br ions (Bolte & Faber, 2001).

The title compound was prepared in two different ways. Firstly, the reaction of 4-picoline with bis(dichlorosilyl)methylamine affords directly the crystals of the title compound. A second way to synthesize (I) is the reaction of liquid dichlorosilane with 4-picoline to form H2SiCl2(4-picoline)2. With an excess of base in chloroform this adduct forms again the title compound.

Experimental top

The title compound was prepared in two different ways: (i) 0.60 ml (3.46 mmol) bis(dichlorosilyl)methylamine, prepared and purified according to Fleischer et al. (1995), was dissolved in 5.0 ml chloroform. Then 1.0 ml (10.24 mmol) 4-picoline was added in portions of 0.2 ml. After several days, colourless crystals had formed. They were isolated, washed with n-hexane, and a single-crystal was selected for the diffraction experiment. (ii) 1.0 ml (13.9 mmol) H2SiCl2 (liquid) was condensed into 50 ml n-hexane and 6.0 ml (66.4 mmol) 4-picoline was added within 30 min whilst the solution was stirred and kept at 213 K. The solution was then allowed to warm to room temperature. The formation of a white precipitate was observed. This precipitate was washed with n-hexane and dried in vacuo. Yield: 100%; C12H16Cl2N2Si (287.3), calculated: C 50.2, H 5.6, Cl 24.7, N 9.8%; found: C 48.3, H 5.7, Cl 25.4, N9.0%; IR (Nujol, NaCl, cm-1): 2922.1 (versus), 2855.3 (versus), 2165.5 (br,s), 1626.8 (s), 1581.1 (s), 1459.6 (versus), 1376.2 (versus), 1315.0 (m), 1203.7 (m), 997.8 (s), 992.6 (s), 825.4 (m). Single crystals were grown from a solution of 150 mg (0.52 mmol) H2SiCl2(4-picoline)2 and 0.2 ml (2.0 mmol) 4-picoline in 3.0 ml CHCl3 at 277 K within 5 d. After cell determination, the selected crystal turned out to contain the identical structure as the former crystal, which was used for data collection. All procedures were carried out under argon (dried with 4 Å molecular sieves and Sicapent) either on a vacuum line or in a glove-box. 4-Picoline was distilled from CaH2 and sealed in ampules. H2SiCl2 (Aldrich, 99.99%) was used without further purification.

Refinement top

All H atoms bonded to C atoms were located by difference Fourier synthesis and refined with fixed individual displacement parameters [U(H) = 1.5Ueq(Cmethyl) or U(H) = 1.2Ueq(C)] using a riding model with C—H(aromatic) = 0.95, CH(methyl) = 0.98 or C—H(tertiary) = 1.00 Å. The methyl groups attached to the aromatic rings were allowed to rotate about their local threefold axis. The H atom bonded to Si was refined isotropically.

Computing details top

Data collection: DIF4 (Stoe & Cie, 1992); cell refinement: DIF4; data reduction: REDU4 (Stoe & Cie, 1992); program(s) used to solve structure: SHELXS97 (Sheldrick, 1990); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: XP in SHELXTL-Plus (Sheldrick, 1991); software used to prepare material for publication: CIFTAB in SHELXL97.

Figures top
[Figure 1] Fig. 1. A perspective view of the cation of (I) with the atom-numbering scheme. Displacement ellipsoids are at the 50% probability level and H atoms are drawn as small spheres of arbitrary radii.
[Figure 2] Fig. 2. A perspective view of the anion and the solvent molecules of (I) with the atom-numbering scheme. Displacement ellipsoids are at the 50% probability level and H atoms are drawn as small spheres of arbitrary radii.
(I) top
Crystal data top
C24H30N4Si2+·2Cl·6CHCl3Z = 1
Mr = 1189.72F(000) = 598
Triclinic, P1Dx = 1.534 Mg m3
a = 9.3854 (8) ÅMo Kα radiation, λ = 0.71073 Å
b = 11.0958 (9) ÅCell parameters from 35 reflections
c = 12.7495 (11) Åθ = 2.3–15.2°
α = 93.018 (5)°µ = 1.11 mm1
β = 101.092 (5)°T = 150 K
γ = 97.548 (4)°Plate, colourless
V = 1287.47 (19) Å30.4 × 0.3 × 0.2 mm
Data collection top
Stoe four-circle
diffractometer
3349 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.017
Graphite monochromatorθmax = 25.0°, θmin = 1.9°
ω/θ scansh = 1110
Absorption correction: ψ scan
(North et al., 1968)
k = 1313
Tmin = 0.665, Tmax = 0.808l = 1415
4775 measured reflections3 standard reflections every 120 min
4518 independent reflections intensity decay: 3%
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.069Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.181H atoms treated by a mixture of independent and constrained refinement
S = 1.19 w = 1/[σ2(Fo2) + (0.0575P)2 + 3.942P]
where P = (Fo2 + 2Fc2)/3
4518 reflections(Δ/σ)max < 0.001
256 parametersΔρmax = 0.81 e Å3
0 restraintsΔρmin = 0.56 e Å3
Crystal data top
C24H30N4Si2+·2Cl·6CHCl3γ = 97.548 (4)°
Mr = 1189.72V = 1287.47 (19) Å3
Triclinic, P1Z = 1
a = 9.3854 (8) ÅMo Kα radiation
b = 11.0958 (9) ŵ = 1.11 mm1
c = 12.7495 (11) ÅT = 150 K
α = 93.018 (5)°0.4 × 0.3 × 0.2 mm
β = 101.092 (5)°
Data collection top
Stoe four-circle
diffractometer
3349 reflections with I > 2σ(I)
Absorption correction: ψ scan
(North et al., 1968)
Rint = 0.017
Tmin = 0.665, Tmax = 0.8083 standard reflections every 120 min
4775 measured reflections intensity decay: 3%
4518 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0690 restraints
wR(F2) = 0.181H atoms treated by a mixture of independent and constrained refinement
S = 1.19Δρmax = 0.81 e Å3
4518 reflectionsΔρmin = 0.56 e Å3
256 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Si10.00000.50000.00000.0296 (4)
H1SI0.108 (5)0.476 (4)0.053 (3)0.016 (11)*
N10.1178 (4)0.6531 (4)0.0666 (3)0.0294 (9)
C10.2401 (6)0.6974 (5)0.0340 (4)0.0344 (12)
H10.26710.65540.02430.041*
C20.3278 (6)0.8019 (5)0.0825 (5)0.0390 (13)
H20.41320.83160.05670.047*
C30.2930 (6)0.8639 (5)0.1680 (4)0.0399 (13)
C40.1651 (6)0.8182 (5)0.1995 (4)0.0404 (13)
H40.13610.85900.25770.048*
C50.0805 (6)0.7155 (5)0.1481 (4)0.0383 (12)
H50.00800.68680.17040.046*
C60.3894 (8)0.9760 (6)0.2251 (6)0.0604 (18)
H6A0.46580.95220.28070.091*
H6B0.33021.02730.25830.091*
H6C0.43531.02180.17360.091*
N20.0881 (4)0.4163 (3)0.1220 (3)0.0308 (9)
C110.0297 (6)0.4069 (5)0.2096 (4)0.0374 (12)
H110.06090.43630.20960.045*
C120.0944 (7)0.3571 (5)0.2986 (5)0.0440 (14)
H120.05050.35460.35980.053*
C130.2251 (7)0.3098 (5)0.2999 (5)0.0460 (14)
C140.2827 (6)0.3168 (5)0.2080 (5)0.0407 (13)
H140.37070.28460.20440.049*
C150.2130 (6)0.3701 (5)0.1226 (5)0.0361 (12)
H150.25500.37460.06060.043*
C160.3002 (9)0.2539 (8)0.3958 (6)0.077 (2)
H16A0.24380.17500.40290.115*
H16B0.30710.30820.46030.115*
H16C0.39900.24200.38700.115*
Cl10.65044 (15)0.25888 (12)0.20878 (11)0.0386 (3)
C310.6162 (7)0.5510 (5)0.2619 (5)0.0461 (14)
H310.60610.46060.26570.055*
Cl20.4844 (2)0.60734 (17)0.32400 (16)0.0677 (5)
Cl30.5845 (2)0.58228 (18)0.12667 (14)0.0658 (5)
Cl40.79421 (19)0.61549 (16)0.32824 (14)0.0595 (4)
C410.7794 (7)0.2108 (6)0.4661 (5)0.0507 (15)
H410.75770.21310.38640.061*
Cl50.7986 (3)0.35853 (18)0.52606 (19)0.0896 (7)
Cl60.9442 (2)0.1520 (2)0.50568 (17)0.0782 (6)
Cl70.6361 (2)0.1190 (2)0.50503 (17)0.0835 (7)
C510.8032 (7)0.0146 (6)0.1422 (5)0.0530 (16)
H510.74040.08000.14680.064*
Cl80.8189 (3)0.0590 (3)0.26041 (18)0.1050 (9)
Cl90.9733 (2)0.08113 (16)0.1209 (2)0.0804 (7)
Cl100.7172 (2)0.09081 (15)0.03440 (15)0.0651 (5)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Si10.0297 (10)0.0215 (9)0.0399 (11)0.0038 (8)0.0129 (9)0.0007 (8)
N10.029 (2)0.024 (2)0.037 (2)0.0056 (17)0.0119 (18)0.0019 (17)
C10.034 (3)0.030 (3)0.042 (3)0.004 (2)0.013 (2)0.004 (2)
C20.039 (3)0.028 (3)0.049 (3)0.006 (2)0.013 (3)0.000 (2)
C30.044 (3)0.030 (3)0.040 (3)0.001 (2)0.003 (2)0.007 (2)
C40.054 (4)0.028 (3)0.037 (3)0.000 (2)0.011 (3)0.006 (2)
C50.040 (3)0.034 (3)0.046 (3)0.005 (2)0.019 (3)0.002 (2)
C60.068 (4)0.047 (4)0.055 (4)0.016 (3)0.004 (3)0.006 (3)
N20.029 (2)0.021 (2)0.043 (2)0.0026 (16)0.0105 (19)0.0021 (17)
C110.038 (3)0.035 (3)0.042 (3)0.009 (2)0.014 (2)0.001 (2)
C120.051 (4)0.048 (3)0.039 (3)0.018 (3)0.016 (3)0.003 (3)
C130.051 (4)0.042 (3)0.040 (3)0.009 (3)0.001 (3)0.005 (3)
C140.035 (3)0.035 (3)0.051 (3)0.009 (2)0.005 (3)0.002 (3)
C150.032 (3)0.031 (3)0.048 (3)0.007 (2)0.013 (2)0.000 (2)
C160.089 (6)0.094 (6)0.050 (4)0.047 (5)0.001 (4)0.008 (4)
Cl10.0443 (8)0.0312 (7)0.0456 (8)0.0125 (6)0.0167 (6)0.0045 (5)
C310.059 (4)0.034 (3)0.049 (3)0.010 (3)0.019 (3)0.006 (3)
Cl20.0625 (11)0.0692 (11)0.0752 (12)0.0079 (9)0.0315 (9)0.0199 (9)
Cl30.0739 (12)0.0751 (12)0.0571 (10)0.0287 (10)0.0201 (9)0.0154 (9)
Cl40.0527 (9)0.0559 (10)0.0682 (11)0.0030 (7)0.0148 (8)0.0083 (8)
C410.059 (4)0.050 (4)0.042 (3)0.009 (3)0.005 (3)0.006 (3)
Cl50.127 (2)0.0533 (11)0.0940 (16)0.0193 (12)0.0350 (14)0.0049 (10)
Cl60.0658 (12)0.0859 (14)0.0810 (13)0.0267 (10)0.0005 (10)0.0026 (11)
Cl70.0661 (12)0.0966 (15)0.0763 (13)0.0176 (11)0.0010 (10)0.0323 (11)
C510.061 (4)0.041 (3)0.058 (4)0.021 (3)0.009 (3)0.003 (3)
Cl80.148 (2)0.126 (2)0.0620 (13)0.0764 (18)0.0263 (14)0.0311 (13)
Cl90.0526 (10)0.0450 (10)0.1359 (19)0.0031 (8)0.0062 (11)0.0060 (11)
Cl100.0751 (12)0.0440 (9)0.0730 (12)0.0101 (8)0.0236 (9)0.0102 (8)
Geometric parameters (Å, º) top
Si1—N2i1.955 (4)C12—C131.394 (8)
Si1—N21.955 (4)C12—H120.950
Si1—N11.955 (4)C13—C141.383 (8)
Si1—N1i1.955 (4)C13—C161.497 (9)
Si1—H1SI1.37 (4)C14—C151.363 (8)
N1—C11.338 (6)C14—H140.950
N1—C51.345 (6)C15—H150.950
C1—C21.371 (7)C16—H16A0.980
C1—H10.950C16—H16B0.980
C2—C31.373 (8)C16—H16C0.980
C2—H20.950C31—Cl31.753 (6)
C3—C41.381 (8)C31—Cl21.754 (6)
C3—C61.501 (8)C31—Cl41.760 (6)
C4—C51.357 (8)C31—H311.000
C4—H40.950C41—Cl51.744 (7)
C5—H50.950C41—Cl71.744 (7)
C6—H6A0.980C41—Cl61.753 (7)
C6—H6B0.980C41—H411.000
C6—H6C0.980C51—Cl81.742 (7)
N2—C111.339 (7)C51—Cl91.746 (7)
N2—C151.339 (6)C51—Cl101.751 (6)
C11—C121.360 (8)C51—H511.000
C11—H110.950
N2i—Si1—N2180.0N2—C11—H11118.5
N2i—Si1—N190.66 (17)C12—C11—H11118.5
N2—Si1—N189.34 (17)C11—C12—C13119.9 (5)
N2i—Si1—N1i89.34 (17)C11—C12—H12120.0
N2—Si1—N1i90.66 (17)C13—C12—H12120.0
N1—Si1—N1i180.0C14—C13—C12116.9 (5)
N2i—Si1—H1SI89.6 (18)C14—C13—C16121.2 (6)
N2—Si1—H1SI90.4 (18)C12—C13—C16121.9 (6)
N1—Si1—H1SI90.8 (18)C15—C14—C13119.9 (5)
N1i—Si1—H1SI89.2 (18)C15—C14—H14120.1
C1—N1—C5117.9 (4)C13—C14—H14120.1
C1—N1—Si1120.9 (3)N2—C15—C14123.1 (5)
C5—N1—Si1121.2 (3)N2—C15—H15118.4
N1—C1—C2121.9 (5)C14—C15—H15118.4
N1—C1—H1119.0C13—C16—H16A109.5
C2—C1—H1119.0C13—C16—H16B109.5
C1—C2—C3120.4 (5)H16A—C16—H16B109.5
C1—C2—H2119.8C13—C16—H16C109.5
C3—C2—H2119.8H16A—C16—H16C109.5
C2—C3—C4117.0 (5)H16B—C16—H16C109.5
C2—C3—C6121.7 (5)Cl3—C31—Cl2109.4 (3)
C4—C3—C6121.3 (5)Cl3—C31—Cl4110.9 (3)
C5—C4—C3120.5 (5)Cl2—C31—Cl4110.5 (3)
C5—C4—H4119.8Cl3—C31—H31108.6
C3—C4—H4119.8Cl2—C31—H31108.6
N1—C5—C4122.2 (5)Cl4—C31—H31108.6
N1—C5—H5118.9Cl5—C41—Cl7110.0 (4)
C4—C5—H5118.9Cl5—C41—Cl6108.8 (4)
C3—C6—H6A109.5Cl7—C41—Cl6110.0 (4)
C3—C6—H6B109.5Cl5—C41—H41109.3
H6A—C6—H6B109.5Cl7—C41—H41109.3
C3—C6—H6C109.5Cl6—C41—H41109.3
H6A—C6—H6C109.5Cl8—C51—Cl9112.2 (4)
H6B—C6—H6C109.5Cl8—C51—Cl10109.0 (4)
C11—N2—C15117.3 (5)Cl9—C51—Cl10109.8 (4)
C11—N2—Si1121.7 (3)Cl8—C51—H51108.6
C15—N2—Si1121.0 (4)Cl9—C51—H51108.6
N2—C11—C12122.9 (5)Cl10—C51—H51108.6
N2i—Si1—N1—C179.2 (4)N1—Si1—N2—C1188.9 (4)
N2—Si1—N1—C1100.8 (4)N1i—Si1—N2—C1191.1 (4)
N2i—Si1—N1—C5102.4 (4)N1—Si1—N2—C1588.5 (4)
N2—Si1—N1—C577.6 (4)N1i—Si1—N2—C1591.5 (4)
C5—N1—C1—C21.2 (8)C15—N2—C11—C122.4 (8)
Si1—N1—C1—C2177.2 (4)Si1—N2—C11—C12175.1 (4)
N1—C1—C2—C31.0 (8)N2—C11—C12—C131.9 (9)
C1—C2—C3—C42.0 (8)C11—C12—C13—C140.1 (9)
C1—C2—C3—C6177.9 (6)C11—C12—C13—C16179.9 (6)
C2—C3—C4—C51.0 (8)C12—C13—C14—C151.1 (8)
C6—C3—C4—C5178.9 (6)C16—C13—C14—C15178.9 (6)
C1—N1—C5—C42.3 (8)C11—N2—C15—C141.2 (7)
Si1—N1—C5—C4176.1 (4)Si1—N2—C15—C14176.4 (4)
C3—C4—C5—N11.2 (9)C13—C14—C15—N20.6 (8)
Symmetry code: (i) x, y+1, z.

Experimental details

Crystal data
Chemical formulaC24H30N4Si2+·2Cl·6CHCl3
Mr1189.72
Crystal system, space groupTriclinic, P1
Temperature (K)150
a, b, c (Å)9.3854 (8), 11.0958 (9), 12.7495 (11)
α, β, γ (°)93.018 (5), 101.092 (5), 97.548 (4)
V3)1287.47 (19)
Z1
Radiation typeMo Kα
µ (mm1)1.11
Crystal size (mm)0.4 × 0.3 × 0.2
Data collection
DiffractometerStoe four-circle
diffractometer
Absorption correctionψ scan
(North et al., 1968)
Tmin, Tmax0.665, 0.808
No. of measured, independent and
observed [I > 2σ(I)] reflections
4775, 4518, 3349
Rint0.017
(sin θ/λ)max1)0.595
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.069, 0.181, 1.19
No. of reflections4518
No. of parameters256
H-atom treatmentH atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å3)0.81, 0.56

Computer programs: DIF4 (Stoe & Cie, 1992), DIF4, REDU4 (Stoe & Cie, 1992), SHELXS97 (Sheldrick, 1990), SHELXL97 (Sheldrick, 1997), XP in SHELXTL-Plus (Sheldrick, 1991), CIFTAB in SHELXL97.

Selected geometric parameters (Å, º) top
Si1—N21.955 (4)Si1—H1SI1.37 (4)
Si1—N11.955 (4)
N2—Si1—N189.34 (17)N1—Si1—H1SI90.8 (18)
N2—Si1—H1SI90.4 (18)
 

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