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The possibility of using Patterson analysis to interpret neutron or X-ray reflectometry data has been critically examined in terms of a hypothetical case study. The technique yields a highly accurate layer profile model provided the data are measured with a beam geometry that gives rise to unit reflectivity at Q = 0 only, i.e. Qc = 0. For those cases where a plateau of unit reflectivity extends out to finite Q, i.e. Qc > 0, a distorted model is obtained. A strategy to significantly improve this initial estimate of the model is proposed and demonstrated.

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