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The chemical, electrochemical, optical and electro-optical properties of titanium oxyfluoride, TiOF2, have led to interest in this compound for a number of applications. Prior analyses have indicated that TiOF2 possesses a simple cubic structure (space group Pm{\overline 3}m) at room temperature. Three-dimensional nanostructured assemblies of polycrystalline TiOF2 have recently been synthesized via chemical conversion of intricate SiO2 structures by metathetic reaction with TiF4(g). Rietveld analysis has been used to evaluate the structure of the TiOF2 product formed by such reaction at 623 K. Unlike prior reports, this TiOF2 product possessed a hexagonal structure (space group R{\overline 3}c) at room temperature. Upon heating through 333-338 K, the hexagonal TiOF2 polymorph converted into cubic (Pm{\overline 3}m) TiOF2. Differential scanning calorimetry and X-ray diffraction analyses have been used to evaluate this thermally induced phase transformation.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0021889810016730/ce5082sup1.cif
Contains datablocks global, TiOF2

rtv

Rietveld powder data file (CIF format) https://doi.org/10.1107/S0021889810016730/ce5082sup2.rtv
Contains datablock TiOF2_Powder_Diffraction

Computing details top

Titanium oxydifluoride top
Crystal data top
TiF2OZ = 6
Mr = 101.86Dx = 3.114 Mg m3
Hexagonal, R3cCu Kα1 radiation, λ = 1.54060 Å
a = 5.3325 (1) ÅT = 298 K
c = 13.2321 (4) Å × × mm
V = 325.86 (1) Å3
Data collection top
PANalytical Alpha1
diffractometer
k = ??
Johansson monochromatorl = ??
h = ??
Refinement top
R[F2 > 2σ(F2)] = 9.70S = 1.64
wR(F2) = 12.64
Crystal data top
TiF2OV = 325.86 (1) Å3
Mr = 101.86Z = 6
Hexagonal, R3cCu Kα1 radiation
a = 5.3325 (1) ÅT = 298 K
c = 13.2321 (4) Å × × mm
Data collection top
PANalytical Alpha1
diffractometer
Refinement top
R[F2 > 2σ(F2)] = 9.70S = 1.64
wR(F2) = 12.64
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
Ti0.0000000.0000000.0000000.010492*
F0.5486 (5)0.0000000.2500000.000000*0.666667
O0.5486 (5)0.0000000.2500000.000762*0.333333
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Ti0.0000000.0000000.0000000.0000000.0000000.000000
F0.0000000.0000000.0000000.0000000.0000000.000000
O0.0000000.0000000.0000000.0000000.0000000.000000
Geometric parameters (Å, º) top
Ti—F1.9112 (3)F—F2.702 (2)
Ti—F1.911 (2)F—F2.702 (2)
Ti—F1.911 (2)F—F2.704 (2)
Ti—F1.911 (2)F—F2.704 (2)
Ti—F1.911 (2)F—F2.704 (1)
Ti—F1.9112 (3)F—F2.704 (1)
F—F2.702 (2)F—F3.442 (2)
F—F2.702 (2)F—F3.442 (2)
F—Ti—F90.04 (6)F—F—F140.4 (2)
F—Ti—F89.96 (7)F—F—F50.43 (3)
F—Ti—F89.96 (6)F—F—F93.02 (9)
F—Ti—F180.0 (2)F—F—F137.9 (2)
F—Ti—F90.04 (7)F—F—F50.48 (4)
F—Ti—F90.0 (1)F—F—Ti45.02 (3)
F—Ti—F180.0 (4)F—F—F127.1 (1)
F—Ti—F89.96 (6)F—F—F169.0 (8)
F—Ti—F90.0 (1)F—F—F60.05 (4)
F—Ti—F90.0 (1)F—F—F59.98 (3)
F—Ti—F90.04 (7)F—F—F90.00 (8)
F—Ti—F180.0 (1)F—F—F124.6 (2)
F—Ti—F90.04 (6)F—F—Ti94.31 (7)
F—Ti—F90.0 (1)F—F—F94.62 (8)
F—Ti—F89.96 (7)F—F—F140.4 (2)
F—F—Ti44.98 (3)F—F—F84.55 (7)
F—F—F101.61 (8)F—F—F101.61 (8)
F—F—F100.91 (7)F—F—F137.9 (2)
F—F—F50.43 (3)F—F—F93.02 (9)
F—F—Ti143.3 (1)Ti—F—F145.9 (2)
F—F—F59.98 (3)Ti—F—F124.1 (1)
F—F—F90.00 (7)Ti—F—F45.02 (4)
F—F—F112.2 (1)Ti—F—F44.98 (3)
F—F—F139.1 (1)Ti—F—F44.98 (5)
F—F—F160.9 (4)Ti—F—F122.3 (1)
F—F—F60.00 (4)F—F—F60.05 (4)
Ti—F—F94.31 (7)F—F—F169.0 (8)
Ti—F—F145.9 (2)F—F—F100.91 (7)
Ti—F—F95.40 (8)F—F—F124.6 (2)
Ti—F—Ti164.4 (1)F—F—F90.00 (8)
Ti—F—F45.02 (3)F—F—F114.4 (1)
Ti—F—F45.02 (4)F—F—F112.2 (1)
Ti—F—F124.1 (1)F—F—F79.09 (7)
Ti—F—F143.3 (1)F—F—F59.98 (5)
Ti—F—F122.3 (1)F—F—F90.00 (7)
Ti—F—F44.98 (5)F—F—F59.98 (5)
F—F—F94.62 (8)F—F—F79.09 (7)
F—F—F102.78 (9)F—F—F60.00 (4)
F—F—Ti95.40 (8)F—F—F160.9 (4)
F—F—F50.48 (4)F—F—F100.9 (1)
F—F—F84.55 (7)

Experimental details

Crystal data
Chemical formulaTiF2O
Mr101.86
Crystal system, space groupHexagonal, R3c
Temperature (K)298
a, c (Å)5.3325 (1), 13.2321 (4)
V3)325.86 (1)
Z6
Radiation typeCu Kα1
µ (mm1)?
Crystal size (mm) × ×
Data collection
DiffractometerPANalytical Alpha1
diffractometer
Absorption correction?
No. of measured, independent and
observed (?) reflections
?, ?, 77
Rint?
Refinement
R[F2 > 2σ(F2)], wR(F2), S 9.70, 12.64, 1.64
No. of reflections?
No. of parameters?
No. of restraints?
Δρmax, Δρmin (e Å3)?, ?

 

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