Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
After consideration of the applicability of classical methods, a novel analysis method for the characterization of fibre void structures is presented, capable of fitting the entire anisotropic two-dimensional scattering pattern to a model of perfectly aligned, polydisperse ellipsoids. It is tested for validity against the computed scattering pattern for a simulated nanostructure, after which it is used to fit the scattering from the void structure of commercially available heat-treated poly(p-phenylene terephtalamide) fibre and its as-spun precursor fibre. The application shows a reasonable fit and results in size distributions for both the lengths and the widths of the ellipsoidal voids. Improvements to the analysis methods are compared, consisting of the introduction of an orientation distribution for the nano-ellipsoids, and the addition of large scatterers to account for the effect of fibrillar scattering on the scattering pattern. The fit to the scattering pattern of as-spun aramid fibre is improved by the introduction of the large scatterers, while the fit to the scattering pattern obtained from the heat-treated fibre improves when an orientation distribution is taken into account. It is concluded that, as a result of the heat treatment, the average width and length of the scatterers increase.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds