Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
Knowledge of the morphology of ion damage trails, `latent ion tracks', typically a few nanometres wide and 10-125 µm long, created along wakes of swift heavy ions in dielectric solids, is a prerequisite for advancement of track applications in nanotechnology. Modeling the tracks as depleted columnar structures with soft to hard boundaries and cylindrical symmetry, the derivation of theoretical track small-angle X-ray scattering cross sections is reported. These quantities enable the determination of track structure parameters, specifically the track electron density function and its radial dispersion, from empirical scattering intensities. The derived expressions can be readily adopted for analysis of small-angle neutron scattering data.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds