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Trisodium dichromium(III) triarsenate, Na3Cr2(AsO4)3, has been synthesized by a solid-state reaction and structurally characterized by single-crystal X-ray diffraction. It has the garnet structure type.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536802019128/br6064sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536802019128/br6064Isup2.hkl
Contains datablock I

Key indicators

  • Single-crystal X-ray study
  • T = 293 K
  • Mean [sigma](As-O) = 0.002 Å
  • R factor = 0.019
  • wR factor = 0.039
  • Data-to-parameter ratio = 12.0

checkCIF results

No syntax errors found

ADDSYM reports no extra symmetry


Yellow Alert Alert Level C:
ABSTM_02 Alert C The ratio of expected to reported Tmax/Tmin(RR) is > 1.10 Tmin and Tmax reported: 0.406 0.508 Tmin and Tmax expected: 0.286 0.445 RR = 1.243 Please check that your absorption correction is appropriate. General Notes
ABSTM_02 When printed, the submitted absorption T values will be replaced by the scaled T values. Since the ratio of scaled T's is identical to the ratio of reported T values, the scaling does not imply a change to the absorption corrections used in the study. Ratio of Tmax expected/reported 0.875 Tmax scaled 0.445 Tmin scaled 0.355 REFLT_03 From the CIF: _diffrn_reflns_theta_max 29.88 From the CIF: _reflns_number_total 216 From the CIF: _diffrn_reflns_limit_ max hkl 17. 17. 10. From the CIF: _diffrn_reflns_limit_ min hkl 0. 0. 0. TEST1: Expected hkl limits for theta max Calculated maximum hkl 17. 17. 17. Calculated minimum hkl -17. -17. -17. ALERT: Expected hkl max differ from CIF values
0 Alert Level A = Potentially serious problem
0 Alert Level B = Potential problem
1 Alert Level C = Please check

Comment top

Until now, in the system Na2O–Cr2O3–As2O5, only the structure compounds lying in the limiting binary system have been studied: NaCrO2 (Ruedorff & Becker, 1977), CrAsO4 (Attfield et al., 1987), Na2As4O11 (Driss et al., 1988), NaAsO3 (Liebau, 1956), Na4As2O7 (Leung & Calvo, 1973) and Na3AsO4 (Palazzi & Remy, 1971).

To our knowledge, only one ternary compound, viz. Na3Cr2(AsO4)3 (Schwarz & Schmidt, 1972), has been reported, but its structure has not been determined. On investigating this system, we synthesized this arsenate and report here the synthesis and crystal structure determination.

Experimental top

The title compound was prepared as previously described by Schwarz & Schmidt (1972), starting from reagent-grade Na2CO3 (Fluka, 99%), (NH4)2Cr2O7 (Prolabo, 99%) and As2O3 (Hoping & Williams, 99.5%) mixed in stoichiometric ratios. The sample was heated first at 773 K for 6 h and the at 1173 K for 60 h and finally quenched to room temperature.

Computing details top

Data collection: CAD-4 EXPRESS (Duisenberg, 1992; Macíček & Yordanov, 1992); cell refinement: CAD-4 EXPRESS; data reduction: XCAD4(Harms & Wocadlo, 1995); program(s) used to solve structure: SHELXS97 (Sheldrick, 1990); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: DIAMOND (Brandenburg, 1998); software used to prepare material for publication: SHELXL97 (Sheldrick, 1997).

Figures top
[Figure 1] Fig. 1.  
trisodium dichrome (III) triarsenate top
Crystal data top
Na3Cr2(AsO4)3Dx = 4.327 Mg m3
Mr = 589.73Mo Kα radiation, λ = 0.71073 Å
Cubic, Ia3dCell parameters from 25 reflections
Hall symbol: -I 4bd 2c 3θ = 10–14°
a = 12.188 (2) ŵ = 13.50 mm1
V = 1810.6 (5) Å3T = 293 K
Z = 8Polyhedral, green
F(000) = 11040.1 × 0.08 × 0.06 mm
Data collection top
Enarf-Nonius CAD-4
diffractometer
194 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.021
Graphite monochromatorθmax = 29.9°, θmin = 4.1°
ω/2θ scansh = 017
Absorption correction: ψ scan
(North et al., 1968)
k = 017
Tmin = 0.406, Tmax = 0.508l = 010
735 measured reflections2 standard reflections every 120 min
216 independent reflections intensity decay: 1.0%
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.019 w = 1/[σ2(Fo2) + (0.0156P)2 + 7.0122P]
where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.039(Δ/σ)max < 0.001
S = 1.14Δρmax = 0.33 e Å3
216 reflectionsΔρmin = 0.40 e Å3
18 parametersExtinction correction: SHELXL97, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
0 restraintsExtinction coefficient: 0.00326 (17)
Crystal data top
Na3Cr2(AsO4)3Z = 8
Mr = 589.73Mo Kα radiation
Cubic, Ia3dµ = 13.50 mm1
a = 12.188 (2) ÅT = 293 K
V = 1810.6 (5) Å30.1 × 0.08 × 0.06 mm
Data collection top
Enarf-Nonius CAD-4
diffractometer
194 reflections with I > 2σ(I)
Absorption correction: ψ scan
(North et al., 1968)
Rint = 0.021
Tmin = 0.406, Tmax = 0.5082 standard reflections every 120 min
735 measured reflections intensity decay: 1.0%
216 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.01918 parameters
wR(F2) = 0.0390 restraints
S = 1.14Δρmax = 0.33 e Å3
216 reflectionsΔρmin = 0.40 e Å3
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
As10.37500.00000.25000.00339 (18)
Cr10.25000.25000.25000.0034 (2)
Na10.12500.00000.25000.0112 (4)
O10.28819 (14)0.09814 (12)0.29743 (13)0.0064 (3)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
As10.0037 (2)0.0032 (2)0.0032 (2)0.0000.0000.000
Cr10.0034 (2)0.0034 (2)0.0034 (2)0.00020 (16)0.00020 (16)0.00020 (16)
Na10.0064 (9)0.0136 (6)0.0136 (6)0.0000.0000.0011 (7)
O10.0076 (8)0.0046 (7)0.0071 (8)0.0016 (6)0.0017 (6)0.0002 (5)
Geometric parameters (Å, º) top
As1—O1i1.6983 (16)Cr1—O1viii1.9942 (15)
As1—O1ii1.6983 (16)Na1—O1ix2.3919 (17)
As1—O11.6984 (16)Na1—O1x2.3919 (17)
As1—O1iii1.6984 (16)Na1—O1iii2.3919 (17)
Cr1—O1iv1.9941 (15)Na1—O12.3919 (17)
Cr1—O1v1.9941 (15)Na1—O1xi2.5337 (17)
Cr1—O1vi1.9942 (15)Na1—O1xii2.5337 (17)
Cr1—O1iii1.9942 (15)Na1—O1xiii2.5337 (17)
Cr1—O1vii1.9942 (15)Na1—O1viii2.5337 (17)
O1i—As1—O1ii102.93 (11)O1x—Na1—O1116.73 (7)
O1i—As1—O1112.84 (6)O1iii—Na1—O167.48 (7)
O1ii—As1—O1112.84 (6)O1ix—Na1—O1xi123.39 (3)
O1i—As1—O1iii112.84 (6)O1x—Na1—O1xi70.40 (7)
O1ii—As1—O1iii112.84 (6)O1iii—Na1—O1xi92.07 (4)
O1—As1—O1iii102.93 (11)O1—Na1—O1xi75.46 (6)
O1iv—Cr1—O1v180.0O1ix—Na1—O1xii70.40 (7)
O1iv—Cr1—O1vi90.87 (7)O1x—Na1—O1xii123.39 (3)
O1v—Cr1—O1vi89.13 (7)O1iii—Na1—O1xii75.46 (6)
O1iv—Cr1—O1iii89.13 (7)O1—Na1—O1xii92.07 (4)
O1v—Cr1—O1iii90.87 (7)O1xi—Na1—O1xii165.15 (7)
O1vi—Cr1—O1iii180.00 (9)O1ix—Na1—O1xiii92.07 (4)
O1iv—Cr1—O1vii90.87 (7)O1x—Na1—O1xiii75.46 (6)
O1v—Cr1—O1vii89.13 (7)O1iii—Na1—O1xiii123.39 (3)
O1vi—Cr1—O1vii90.87 (7)O1—Na1—O1xiii70.40 (7)
O1iii—Cr1—O1vii89.13 (7)O1xi—Na1—O1xiii112.01 (8)
O1iv—Cr1—O1viii89.13 (7)O1xii—Na1—O1xiii70.04 (8)
O1v—Cr1—O1viii90.87 (7)O1ix—Na1—O1viii75.46 (6)
O1vi—Cr1—O1viii89.13 (7)O1x—Na1—O1viii92.07 (4)
O1iii—Cr1—O1viii90.87 (7)O1iii—Na1—O1viii70.40 (7)
O1vii—Cr1—O1viii180.00 (9)O1—Na1—O1viii123.39 (3)
O1ix—Na1—O1x67.48 (7)O1xi—Na1—O1viii70.04 (8)
O1ix—Na1—O1iii116.73 (7)O1xii—Na1—O1viii112.01 (8)
O1x—Na1—O1iii158.94 (7)O1xiii—Na1—O1viii165.15 (7)
O1ix—Na1—O1158.94 (7)
Symmetry codes: (i) x+3/4, z1/4, y+1/4; (ii) x+3/4, z+1/4, y+1/4; (iii) x, y, z+1/2; (iv) z, x+1/2, y+1/2; (v) z+1/2, x, y; (vi) x+1/2, y+1/2, z; (vii) y+1/2, z, x+1/2; (viii) y, z+1/2, x; (ix) x+1/4, z1/4, y+1/4; (x) x+1/4, z+1/4, y+1/4; (xi) y+1/4, x1/4, z+3/4; (xii) y+1/4, x+1/4, z1/4; (xiii) y, z1/2, x+1/2.

Experimental details

Crystal data
Chemical formulaNa3Cr2(AsO4)3
Mr589.73
Crystal system, space groupCubic, Ia3d
Temperature (K)293
a (Å)12.188 (2)
V3)1810.6 (5)
Z8
Radiation typeMo Kα
µ (mm1)13.50
Crystal size (mm)0.1 × 0.08 × 0.06
Data collection
DiffractometerEnarf-Nonius CAD-4
diffractometer
Absorption correctionψ scan
(North et al., 1968)
Tmin, Tmax0.406, 0.508
No. of measured, independent and
observed [I > 2σ(I)] reflections
735, 216, 194
Rint0.021
(sin θ/λ)max1)0.701
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.019, 0.039, 1.14
No. of reflections216
No. of parameters18
Δρmax, Δρmin (e Å3)0.33, 0.40

Computer programs: CAD-4 EXPRESS (Duisenberg, 1992; Macíček & Yordanov, 1992), CAD-4 EXPRESS, XCAD4(Harms & Wocadlo, 1995), SHELXS97 (Sheldrick, 1990), SHELXL97 (Sheldrick, 1997), DIAMOND (Brandenburg, 1998).

Selected bond lengths (Å) top
As1—O1i1.6983 (16)Cr1—O1iii1.9942 (15)
As1—O11.6984 (16)Na1—O1iv2.3919 (17)
Cr1—O1ii1.9941 (15)Na1—O1v2.5337 (17)
Symmetry codes: (i) x+3/4, z1/4, y+1/4; (ii) z, x+1/2, y+1/2; (iii) x+1/2, y+1/2, z; (iv) x+1/4, z1/4, y+1/4; (v) y+1/4, x1/4, z+3/4.
 

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