Supporting information
Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536801020062/br6029sup1.cif | |
Structure factor file (CIF format) https://doi.org/10.1107/S1600536801020062/br6029Isup2.hkl |
Single crystals of the YbCoGaO4 were grown by floating zone technique for the first time. 99.999% pure reagents were used, preannealed before mixing. The growth rate was 1.7 mm h-1, rotation used was 30 r.p..m for the feed rod and 25 r.p.m. for the seed rod. The total growth was 41.5 mm. Growth was perpendicular to the c axis in the hexagonal system. The experimental details concerning crystal growth and magnetic characterization will be published elsewhere (Dabkowska et al., 2001). Samples for X-ray structure determination and electron microprobe were cut from the top part of the grown rod. Crushed crystals were examined using a Guinier-Haag camera, with Cu Kα1 radiation and silicon as an internal standard. Intensity and peak positions were determined using a film scanner (LS-20 Kej Instruments, Sweden). The pattern was indexed on the basis of the hexagonal cell. The lattice constant were refined using LSUDF program and the results are in good agreement with both powder diffraction data (Kimizuka & Takayama, 1982) and the single-crystal measurement given in the Crystal Data Table.
Refinement of the structure required a 50:50 distribution of Co and Ga on the same site, with common coordinates and displacement parameters. The Yb z coordinate refined slightly off the 3 m site, improving the displacement parameter refinement and residuals. The relatively large anisotropic displacement parameters for O2 are likely a result of the variation in coordination at the Co/Ga site. The sample used for the experiment was a 10 µm flake from the bulk sample. The equatorial edges were not natural faces. An analytical face correction using approximate faces and distances in Sheldrick's XPREP (Sheldrick, 1997) did not provide as good a correction (based on Rint) as did the empirical correction from SADABS (Sheldrick, 2000). The volume of the sample could have been reduced, but this would have prevented the collection of high-resolution data.
Data collection: SMART (Bruker, 1997); cell refinement: SMART; data reduction: SAINT (Bruker, 1997); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997a); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997a); molecular graphics: SHELXTL (Sheldrick, 1997b); software used to prepare material for publication: SHELXTL.
Fig. 1. 90% displacement ellipsoid plot of the oxide layers as viewed normal to the c axis. |
YbCoGaO4 | F(000) = 480 |
Mr = 365.69 | Dx = 7.174 Mg m−3 |
Rombohedral, R3m | Melting point: 1750 K K |
a = 3.4165 (1) Å | Mo Kα radiation, λ = 0.71073 Å |
b = 3.4165 (1) Å | Cell parameters from 1391 reflections |
c = 25.122 (1) Å | θ = 2.4–36.2° |
α = 90° | µ = 39.98 mm−1 |
β = 90° | T = 299 K |
γ = 120° | Plate, black |
V = 253.95 (2) Å3 | 0.22 × 0.16 × 0.01 mm |
Z = 3 |
CCD diffractometer | 187 independent reflections |
Radiation source: rotating anode | 178 reflections with I > 2σ(I) |
Graphite monochromator | Rint = 0.047 |
ϕ and ω scans | θmax = 36.2°, θmin = 2.4° |
Absorption correction: multi-scan (SADABS; Sheldrick, 2000) | h = −4→5 |
Tmin = 0.023, Tmax = 0.142 | k = −5→4 |
1932 measured reflections | l = −40→37 |
Refinement on F2 | Primary atom site location: structure-invariant direct methods |
Least-squares matrix: full | Secondary atom site location: difference Fourier map |
R[F2 > 2σ(F2)] = 0.027 | w = 1/[σ2(Fo2) + (0.0345P)2 + 4.4469P] where P = (Fo2 + 2Fc2)/3 |
wR(F2) = 0.062 | (Δ/σ)max < 0.001 |
S = 1.16 | Δρmax = 2.94 e Å−3 |
187 reflections | Δρmin = −2.88 e Å−3 |
14 parameters | Extinction correction: SHELXL97, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4 |
0 restraints | Extinction coefficient: 0.049 (4) |
YbCoGaO4 | γ = 120° |
Mr = 365.69 | V = 253.95 (2) Å3 |
Rombohedral, R3m | Z = 3 |
a = 3.4165 (1) Å | Mo Kα radiation |
b = 3.4165 (1) Å | µ = 39.98 mm−1 |
c = 25.122 (1) Å | T = 299 K |
α = 90° | 0.22 × 0.16 × 0.01 mm |
β = 90° |
CCD diffractometer | 187 independent reflections |
Absorption correction: multi-scan (SADABS; Sheldrick, 2000) | 178 reflections with I > 2σ(I) |
Tmin = 0.023, Tmax = 0.142 | Rint = 0.047 |
1932 measured reflections |
R[F2 > 2σ(F2)] = 0.027 | 14 parameters |
wR(F2) = 0.062 | 0 restraints |
S = 1.16 | Δρmax = 2.94 e Å−3 |
187 reflections | Δρmin = −2.88 e Å−3 |
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes. |
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
x | y | z | Uiso*/Ueq | Occ. (<1) | |
Yb1 | 0.0000 | 0.0000 | 0.0048 (3) | 0.0037 (10) | 0.50 |
Co1 | 0.0000 | 0.0000 | 0.21469 (4) | 0.0028 (3) | 0.50 |
Ga1 | 0.0000 | 0.0000 | 0.21469 (4) | 0.0028 (3) | 0.50 |
O1 | 0.0000 | 0.0000 | 0.2913 (3) | 0.0058 (11) | |
O2 | 0.0000 | 0.0000 | 0.1293 (4) | 0.0133 (14) |
U11 | U22 | U33 | U12 | U13 | U23 | |
Yb1 | 0.0006 (3) | 0.0006 (3) | 0.010 (3) | 0.00032 (13) | 0.000 | 0.000 |
Co1 | 0.0033 (3) | 0.0033 (3) | 0.0020 (6) | 0.00164 (16) | 0.000 | 0.000 |
Ga1 | 0.0033 (3) | 0.0033 (3) | 0.0020 (6) | 0.00164 (16) | 0.000 | 0.000 |
O1 | 0.0069 (15) | 0.0069 (15) | 0.003 (3) | 0.0035 (7) | 0.000 | 0.000 |
O2 | 0.0131 (19) | 0.0131 (19) | 0.014 (4) | 0.0065 (10) | 0.000 | 0.000 |
Yb1—O1i | 2.182 (4) | Co1—O2i | 1.9907 (12) |
Yb1—O1ii | 2.296 (6) | Co1—O2 | 2.144 (9) |
Co1—O1 | 1.926 (7) | ||
O1i—Yb1—O1iii | 103.0 (3) | Co1—O1—Yb1i | 115.3 (2) |
O1i—Yb1—O1ii | 174.5 (4) | Yb1i—O1—Yb1iii | 103.0 (3) |
O1iv—Yb1—O1ii | 80.3 (2) | Co1—O1—Yb1vi | 120.8 (3) |
O1ii—Yb1—O1v | 96.1 (3) | Yb1i—O1—Yb1vi | 5.5 (4) |
O1—Co1—O2i | 97.8 (3) | Yb1iii—O1—Yb1vi | 99.7 (2) |
O2iii—Co1—O2i | 118.21 (12) | Yb1vi—O1—Yb1vii | 96.1 (3) |
O1—Co1—O2 | 180.000 (1) | Co1iii—O2—Co1i | 118.21 (12) |
O2i—Co1—O2 | 82.2 (3) | Co1iv—O2—Co1 | 97.8 (3) |
O1—Co1—Yb1i | 34.60 (8) |
Symmetry codes: (i) −x+2/3, −y+1/3, −z+1/3; (ii) x−2/3, y−1/3, z−1/3; (iii) −x−1/3, −y−2/3, −z+1/3; (iv) −x−1/3, −y+1/3, −z+1/3; (v) x+1/3, y+2/3, z−1/3; (vi) x+2/3, y+1/3, z+1/3; (vii) x−1/3, y−2/3, z+1/3. |
Experimental details
Crystal data | |
Chemical formula | YbCoGaO4 |
Mr | 365.69 |
Crystal system, space group | Rombohedral, R3m |
Temperature (K) | 299 |
a, b, c (Å) | 3.4165 (1), 3.4165 (1), 25.122 (1) |
α, β, γ (°) | 90, 90, 120 |
V (Å3) | 253.95 (2) |
Z | 3 |
Radiation type | Mo Kα |
µ (mm−1) | 39.98 |
Crystal size (mm) | 0.22 × 0.16 × 0.01 |
Data collection | |
Diffractometer | CCD diffractometer |
Absorption correction | Multi-scan (SADABS; Sheldrick, 2000) |
Tmin, Tmax | 0.023, 0.142 |
No. of measured, independent and observed [I > 2σ(I)] reflections | 1932, 187, 178 |
Rint | 0.047 |
(sin θ/λ)max (Å−1) | 0.830 |
Refinement | |
R[F2 > 2σ(F2)], wR(F2), S | 0.027, 0.062, 1.16 |
No. of reflections | 187 |
No. of parameters | 14 |
Δρmax, Δρmin (e Å−3) | 2.94, −2.88 |
Computer programs: SMART (Bruker, 1997), SMART, SAINT (Bruker, 1997), SHELXS97 (Sheldrick, 1997a), SHELXL97 (Sheldrick, 1997a), SHELXTL (Sheldrick, 1997b), SHELXTL.
Yb1—O1i | 2.182 (4) | Co1—O2i | 1.9907 (12) |
Yb1—O1ii | 2.296 (6) | Co1—O2 | 2.144 (9) |
Co1—O1 | 1.926 (7) |
Symmetry codes: (i) −x+2/3, −y+1/3, −z+1/3; (ii) x−2/3, y−1/3, z−1/3. |
Single crystals of YbCoGaO4 have been structurally characterized. The refined structure is similar to that of other materials belonging to YbFe2O4 family (Cava et al., 1998). Yb is bounded to six O atoms and is found in layers of flattened edge-shared octahedra. It is slightly disordered in the c direction. Five-coordinate Co and Ga atoms are statistically distributed in a double layer of face-shared trigonal bipyramids interleaving the Yb layers, as shown in Fig. 1. These alternating Yb and Co,Ga layers exhibit a corner-shared stacking in the direction of the c axis. The electron microprobe chemical analysis (EPMA) confirms the 1:1 distribution of Co and Ga on the Fe site. Magnetic measurements suggest spin glass behavior with ordering temperature around 20 K. Electrical conductivity was found to be of the order of 105 A m and anisotropic.